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Jitter Measurement and Timing Analysis

Jitter Measurement and Timing Analysis

Understanding timing jitter has become a mandatory part of high-speed communications system design as today’s serial data standards require extensive jitter compliance tests.  Tektronix' comprehensive test instrumentation portfolio enables you to meet your design goals and compliance requirements – fast.

  • TekScope AnywhereTM Waveform Analysis:  Users now have the flexibility to perform timing, eye, and jitter analysis outside the lab that can easily be shared between team members in a networked environment.
  • 80SJNB Jitter, Timing, and SDLA Visualizer Analysis for Sampling Oscilloscopes: 80SJNB is an all-purpose tool that enables engineers to specify a de-embed filter, Time Domain Waveform or S-Parameter for channel embedding. 80SJNB also performs timing, noise and mask testing analysis to get a 3-D view of the eye diagram performance for deep, accurate evaluation on signals with speeds beyond 50GHz.

 

Featured Content

Jitter Fact Sheet

Understanding and Characterizing Timing Jitter Primer

Anatomy of Jitter

Whether you need a quick clock jitter measurement or a thorough analysis of a BER performance problem, Tektronix oscilloscopes and integrated software tools deliver. You can rapidly solve problems and meet your design goals and compliance requirements.
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Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. This paper focuses primarily on jitter in electrical systems.

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This webinar describes the different categories and types of jitter; the origins and interrelationships and how they can be used to diagnois, characterize and debug system hardware. Plus, explain how these various jitter measurements are applicable to your specific application.
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